Non-Contact Microstructure Inspection
Non-Contact Microstructure Inspection
Reveal fine microstructures, assess surface uniformity and inspect precision components without contact or destructive preparation.
Sample: Femtosecond laser-textured stainless steel
Optical configuration: 40× objective, NA 0.75
Inspection method: Non-contact optical imaging in air, without destructive sample preparation.
Application: Characterization of laser-induced microstructures, surface morphology and local manufacturing variations.
Sample: Zirconia ceramic (ZrO₂) structured by Direct Laser Interference Patterning (DLIP).
Optical configuration: 40× objective, NA 0.75, 450 nm illumination.
Lateral resolution: Approximately 120 nm.
Inspection method: High-resolution optical imaging of periodic laser-induced microstructures over extended surface areas.
Application: Assessment of pattern uniformity, fine structural features and local variations for laser process optimization and industrial quality control.
Sample: Microstructured polymer photonic chip for microfluidic applications.
Optical configuration: 20× objective, NA 0.5, 405 nm illumination.
Inspection method: Non-contact optical imaging compared with conventional widefield microscopy using the same objective and illumination wavelength
Demonstrated capability: Enhanced visibility and contrast of fine surface structures compared with the widefield image.
Application: Inspection of polymer microstructures, feature uniformity and manufacturing defects in photonic and microfluidic devices.
Evaluate your own samples with IotaMetrix through a dedicated feasibility study.