Static Model, version: ix01
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Static optical nanometrology system
Designed for laboratory and industrial R&D environments, the IotaMetrix static system enables non-destructive nanoscale inspection of surfaces, transparent materials and precision components.
A benchtop optical nanometrology system for non-destructive nanoscale inspection without contact, vacuum or complex sample preparation.
Key technical characteristics
Resolution and speed
Resolution and speed
Interchangeable objective lens system
Lateral resolution: up to 90 nm
Acquisition rate: 1 image (60 µm field of view) per 0.2 s (100 x, NA=1.13)
Illumination and optical sectioning
Illumination and optical sectioning
Illumination range: 350 – 800 nm
Optical sectioning for surface and volume inspection
Depth of field: 0.2–2 µm, depending on configuration
Sample compatibility
Sample compatibility
Compatible with glass, silicon, polymers, ceramics, metals and transparent materials
Works with transparent and semi-transparent substrates
Suitable for structured, polished and functionalized surfaces
Dimensions
Dimensions
Static unit: W 25 cm × L 35 cm × H 45 cm
Weight: 25 kg
Compatible with benchtop use or optical breadboard mounting
contact@iotametrix.fr | 1 Avenue d'Ester, Ester TECHNOPOLE, 87069 Limoges, France |
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