CIR-approved R&D service provider in France
CIR-approved R&D service provider in France
Non-destructive nanoscale inspection
High-resolution optical metrology for industrial quality control, without contact or complex sample preparation.
From microstructured surfaces to quantitative 3D metrology and transparent materials, explore how IotaMetrix can address your measurement challenges.
Why IotaMetrix?
A practical alternative to conventional nanoscale inspection methods, designed for advanced materials, transparent samples and industrial environments.
Nanoscale resolution
Reveal surface details beyond conventional optical inspection.
Non-destructive analysis
No contact, no coating, no vacuum, and no complex sample preparation.
Real-time measurements
Get actionable information faster than conventional nanoscale inspection workflows.
Built for industrial use
Designed for advanced materials, transparent samples, and future in-line inspection.
From large-area inspection to real-time nanoscale detail
IotaMetrix helps industrial teams inspect extended surfaces, observe nanoscale structures in motion, and perform measurements without complex sample preparation.
High-resolution imaging over extended surfaces.
Nanostructured metallic surface inspection
Observe fine surface structures while the sample is moving.
In-situ surface analysis
Place the sample under the objective and start measuring.
System operation example
Start with a feasibility study
Our engineering services allow industrial and R&D teams to evaluate IotaMetrix technology on their own samples through a structured feasibility study. Each request is reviewed to define the scope, expected results and quotation.