Reveal the Invisible. Real-time.
Label-Free. Anywhere.
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Real-time, non-destructive analysis of transparent and advanced materials — directly on the production line or in the lab.
Up to 90 nm lateral resolution
In-situ measurements
Non-destructive analysis
Compatible with production lines
Bio & transparent materials
Compare the scale and versatility of our label-free optical nanometrology with traditional imaging methods
Compare the scale and versatility of our label-free optical nanometrology with traditional imaging methods
Large surface inspection without constraint
Large surface inspection without constraint
Highly-resolved images at any size
Nanostructured metallic surface inspection
In-situ surface analysis
Real time imaging
Real time imaging
High adquisition rate
(300 µm²/s at maximal resolution)
Small Details, Big Impact,
Label-Free.
Microalgea (diatom shell)
contact@iotametrix.fr | 1 Avenue d'Ester, Ester TECHNOPOLE, 87069 Limoges, France |
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