Reveal nanoscale defects. Real-time.
Non-destructive. Production-ready.
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Optical nanometrology for industrial quality control
Detect nanoscale defects in real time, without contact or complex sample preparation.
Why IotaMetrix?
A practical alternative to conventional nanoscale inspection methods, designed for advanced materials, transparent samples and industrial environments.
Nanoscale resolution
Reveal surface details beyond conventional optical inspection.
Non-destructive analysis
No contact, no coating, no vacuum, and no complex sample preparation.
Real-time measurements
Get actionable information faster than conventional nanoscale inspection workflows.
Built for industrial use
Designed for advanced materials, transparent samples, and future in-line inspection.
From large-area inspection to real-time nanoscale detail
IotaMetrix helps industrial teams inspect extended surfaces, observe nanoscale structures in motion, and perform measurements without complex sample preparation.
Large-area inspection
Large-area inspection
High-resolution imaging over extended surfaces.
Nanostructured metallic surface inspection
Real-time nanoscale imaging
Real-time nanoscale imaging
Observe fine surface structures while the sample is moving.
In-situ surface analysis
No complex preparation
No complex preparation
Place the sample under the objective and start measuring.
System operation example
Start with a feasibility study
Our engineering services allow industrial and R&D teams to evaluate IotaMetrix technology on their own samples through a structured feasibility study. Each request is reviewed to define the scope, expected results and quotation.
contact@iotametrix.fr | 1 Avenue d'Ester, Ester TECHNOPOLE, 87069 Limoges, France |
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